Flaw Detection Capabilities of Dual Linear Array (DLA) and Dual Matrix Array (DMA) Phased Array Probes

In this Evident Around the World video, Stephan Couture demonstrates the detection capabilities and resolution of Dual Linear Array (DLA) and Dual Matrix Array (DMA) phased array probes. Using a 100 mm (4 in.) thick stainless steel block and the onboard total focusing method (TFM) technology of the OmniScan™ X3 flaw detector, he demonstrates the signal response of A27, A26, and A36 probes on side-drilled holes (SDH) and surface notches. This video will help you understand the capabilities of each probe and wedge model, and guide you in making the right choice for your application needs.

Watch more Evident Around the World OmniScan X3 tutorials at www.olympus-ims.com/evident-around-the-world/omniscan-x3/.