Bryan Kenzie: About the Author
TWI
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Published Articles
July/August 2005 Inspectioneering Journal
The ultrasonic Time of Flight Diffraction (TOFD) technique was developed for the UK nuclear industry during the 1970s to provide a method for measuring the height of planar flaws. TOFD is now generally recognized as the most accurate ultrasonic technique for measuring the height of embedded planar flaws (eg. Cracks, lack of fusion, etc.) that lies perpendicular to the surface.
Authors:
Bryan Kenzie, Julian Speck